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Displaying 151 - 164 of 164

Inkjet Metrology and Standards for Ion Mobility Spectrometry

September 1, 2007
Author(s)
R M. Verkouteren, J Brazin, Eric S. Windsor, Robert A. Fletcher, R Maditz, Wayne Smith, John G. Gillen
Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband

Methylmercury inTtuna: Demonstrating Measurement Capabilities and Evaluating Comparability of Results Worldwide From the CCQM P-39 Comparison

October 12, 2021
Author(s)
C Quetel, J P. Snell, Y Aregbe, L Abranko, Z S. Jokai, C Brunori, R Morabito, W Hagan, S. Azemard, E Wyse, V Fajon, M. Horvat, M. Logar, O.F. X. Donard, E Krupp, J Entwisle, R Hearn, Michele M. Schantz, K Inagaki, A Takatsu, P Grinberg, S. N. Willie, H Hintelmann, E Bjorn, E Blanco Gonzalez, G Centineo, J Ignacio Garcia Alonso, A Sanz-Medel
Six Metrology Institutes (NMIs), representing at the Comit International des Poids et Mesures (CIPM) 4 Member States of the Metre Convention and 2 international organisations, and 8 expert laboratories selected outside CIPM have compared their capabilities
Displaying 151 - 164 of 164
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