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Displaying 43426 - 43450 of 74079

Crack Growth in Sapphire

January 1, 2002
Author(s)
Sheldon M. Wiederhorn, Ralph Krause
Crack growth was studied in sapphire on both the m-plane and the r-plane (rhombohedral twin plane). Crack growth on the m-plane fit a power law function of stress intensity factor and an Arrhenius function of temperature. Crack growth on r-plane double

Damage Testing of Partial Reflectors for 157 nm Laser Calorimeters

January 1, 2002
Author(s)
Holger Laabs, Richard D. Jones, Christopher L. Cromer, Marla L. Dowell, V. Liberman
We determined the damage thresholds and lifetimes of several materials using 157 and 193 nm excimer lasers and a beam profile technique similar to that described in ISO 11254-2. We made these measurements to select an appropriate absorbing material for use

Database for Solder Properties With Emphasis on New Lead-Free Solders

January 1, 2002
Author(s)
David R. Smith, Thomas A. Siewert, L Stephen, Juan C. Madeni
Legal and environmental considerations require that the electronics industries cease using solders containing lead. This database provides properties of lead-free solders that may be used to replace the solders containing lead that are currently in use

Deformation of Gauge Blocks

January 1, 2002
Author(s)
Theodore D. Doiron, Eric S. Stanfield, Dennis S. Everett
When a force is exerted on any material, the material deforms. Most of the time the effect is small and is neglected. In the measurement of gauge blocks, where the uncertainty goal is stated in nanometers, the deformation is a very large effect, and can be

Dependence Characteristics of Face Recognition Algorithms

January 1, 2002
Author(s)
Andrew L. Rukhin, Patrick J. Grother, P J. Phillips, Stefan D. Leigh, E M. Newton, Nathanael A. Heckert
Nonparametric statistics for quantifying dependence between the output rankings of face recognition algorithms are described. Analysis of the archived results of a large face recognition study shows that even the better algorithms exhibit significantly

Development of the Web-Based NIST X-Ray Photoelectron Spectroscopy (XPS) Database

January 1, 2002
Author(s)
Angela Y. Lee, D M. Blakeslee, Cedric J. Powell, J R. Rumble
The first web-based version of the NIST X-ray Photoelectron Spectroscopy Database (XPSDB) is described. The current database, built from a relational database management system (RDBMS), contains critically evaluated data with over 19,000 line positions
Displaying 43426 - 43450 of 74079