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Publications

NIST Authors in Bold

Displaying 1 - 25 of 104

Optoelectronic Intelligence

Author(s)
Jeffrey Shainline
To design and construct hardware for general intelligence, we must consider principles of both neuroscience and very-large-scale integration. For large neural

Neural Networks for Classifying Probability Distributions

Author(s)
Siham Khoussi, Nathanael Heckert, Abdella Battou, Saddek Bensalem
Probability distribution fitting of an unknown stochastic process is an important preliminary step for any further analysis in science or engineering. However

The Industrial Ontologies Foundry (IOF) perspectives

Author(s)
Mohamed H. Karray, Neil Otte, Rahul Rai, Farhad Ameri, Boonserm Kulvatunyou, Barry Smith, Dimitris Kiritsis, Chris Will, Rebecca Arista
In recent years there has been a number of promising technical and institutional developments regarding use of ontologies in industry. At the same time, however

Trust and Artificial Intelligence

Author(s)
Brian Stanton, Theodore Jensen
The artificial intelligence (AI) revolution is upon us, with the promise of advances such as driverless cars, smart buildings, automated health diagnostics and

Predicting Flashover Occurrence using Surrogate Temperature Data

Author(s)
Wai Cheong Tam, Eugene Yujun Fu, Richard Peacock, Paul Reneke, Jun Wang, Grace Ngai, Hong Va Leong, Thomas Cleary
Fire fighter fatalities and injuries in the U.S. remain too high and fire fighting too hazardous. Until now, fire fighters rely only on their experience to

Technical Language Processing: Unlocking Maintenance Knowledge

Author(s)
Michael P. Brundage, Thurston B. Sexton, Melinda Hodkiewicz, Alden A. Dima, Sarah Lukens
Out-of-the-box natural-language processing (NLP) pipelines need re-imagining to understand and meet the requirements of the engineering sector. Text-based

Temporal Memory with Magnetic Racetracks

Author(s)
Hamed Vakili, Mohammed N. Sakib, Samiran Ganguly, Mircea Stan, Matthew W. Daniels, Advait Madhavan, Mark D. Stiles, Avik W. Ghosh
Race logic is a relative timing code that represents information in a wavefront of digital edges on a set of wires in order to accelerate dynamic programming

Six-sigma Quality Management of Additive Manufacturing

Author(s)
Yan Lu, Hui Yang, Paul Witherell
Quality is a key determinant in deploying new processes, products or services, and influences the adoption of emerging manufacturing technologies. The advent of

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

Author(s)
Kamal Choudhary, Kevin F. Garrity, Andrew C. Reid, Brian DeCost, Adam J. Biacchi, Angela Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe
The Joint Automated Repository for Various Integrated Simulations (JARVIS) is an integrated infrastructure to accelerate materials discovery and design using
Displaying 1 - 25 of 104