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Publications

NIST Authors in Bold

Displaying 1 - 25 of 87

Technical Language Processing: Unlocking Maintenance Knowledge

Author(s)
Michael P. Brundage, Thurston B. Sexton, Melinda Hodkiewicz, Alden A. Dima, Sarah Lukens
Out-of-the-box natural-language processing (NLP) pipelines need re-imagining to understand and meet the requirements of the engineering sector. Text-based

Temporal Memory with Magnetic Racetracks

Author(s)
Hamed Vakili, Mohammed N. Sakib, Samiran Ganguly, Mircea Stan, Matthew W. Daniels, Advait Madhavan, Mark D. Stiles, Avik W. Ghosh
Race logic is a relative timing code that represents information in a wavefront of digital edges on a set of wires in order to accelerate dynamic programming

Six-sigma Quality Management of Additive Manufacturing

Author(s)
Yan Lu, Hui Yang, Paul Witherell
Quality is a key determinant in deploying new processes, products or services, and influences the adoption of emerging manufacturing technologies. The advent of

International Workshop on Deep Video Understanding

Author(s)
Keith Curtis, George M. Awad, Shahzad K. Rajput, Ian M. Soboroff
This is the introduction paper to the International Workshop on Deep Video Understanding. In recent years, a growing trend towards working on understanding

Four Principles of Explainable Artificial Intelligence (Draft)

Author(s)
P J. Phillips, Amanda C. Hahn, Peter C. Fontana, David A. Broniatowski, Mark A. Przybocki
We introduce four principles for explainable artificial intelligence (AI) that comprise the fundamental properties for explainable AI systems. They were

NIST 2020 CTS Speaker Recognition Challenge Evaluation Plan

Author(s)
Seyed Omid Sadjadi, Craig S. Greenberg, Elliot Singer, Douglas A. Reynolds, Lisa Mason
Following the success of the 2019 Conversational Telephone Speech (CTS) Speaker Recognition Challenge, which received 1347 submissions from 67 academic and

Detection of Dense, Overlapping, Geometric Objects

Author(s)
Adele P. Peskin, Boris Wilthan, Michael P. Majurski
Using a unique data collection, we are able to study the detection of dense geometric objects in image data where object density, clarity, and size vary. The

MSEC: A QUANTITATIVE RETROSPECTIVE

Author(s)
Thurston B. Sexton, Michael P. Brundage, Alden A. Dima, Michael E. Sharp
The Manufacturing Science and Engineering Conference (MSEC) in 2020 is the 15th annual conference put on by the Manufacturing Engineering Division (MED) of ASME
Displaying 1 - 25 of 87