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Displaying 22926 - 22950 of 143793

3.5 GHz Radar Waveform Capture at Fort Story

August 4, 2017
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Peter J. Jeavons, Michael R. Souryal, Adam J. Wunderlich, Mark Lofquist
We describe measurements to create a library of high-fidelity waveforms of federal incumbent radar signals currently operating in the 3550 MHz – 3650 MHz (“3.5 GHz”) band. In this second phase of assembling the library, measurements were collected at Fort

Identifying Vulnerable Populations to Death and Injuries from Residential Fires

August 4, 2017
Author(s)
Stanley W. Gilbert, David T. Butry
Residential fire casualty risk is a function of an individual’s exposure risk and vulnerability. The previous literature focuses on measuring correlations between socioeconomic factors and casualties, and identifies at-risk population. This study controls

Microanalysis: What Is It, Where Did It Come From, and Where Is It Going?

August 4, 2017
Author(s)
Dale E. Newbury
"Microanalysis" in the parlance of the Microanalysis Society (MAS) refers to spatially-resolved elemental and molecular analysis performed at the micrometer to nanometer to picometer scales by any combination of excitation and analytical spectrometry that

Multiple method analysis of TiO2 nanoparticles uptake, accumulation and effects in rice (Oryza sativa L.) plants

August 4, 2017
Author(s)
Yinqging Deng, Elijah Petersen, Katie Challis, Savelas A. Rabb, Richard D. Holbrook, James Ranville, Bryant C. Nelson, Baoshan Xing
Understanding the translocation of nanoparticles (NPs) into plants is challenging because quantitative and qualitative methods are still being developed and the comparability of results among different methods is unclear. In this study, the uptake of NPs

SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector

August 4, 2017
Author(s)
Dale E. Newbury, Nicholas W. Ritchie, Michael J. Mengason, Keana C. Scott
Elemental trace analysis by electron-excited x-ray spectrometry performed in the scanning electron microscope (SEM) with energy dispersive x-ray spectrometry (EDS) can reach a limit of detection of 0.0005 mass fraction for many elements. Exceptions include

Structural and electrical analysis of epitaxial 2D/3D vertical heterojunctions of monolayer MoS2 on GaN

August 4, 2017
Author(s)
Albert Davydov, Terrance P. O'Regan, Andrew A. Herzing, Dimitry Ruzmetov, Robert A. Burke, Kehao Zhang, A. Glen Birdwell, DeCarlos Taylor, E Byrd, Joshua A. Robinson, Tony G. Ivanov, M R. Neupane, S D. Walck
Integrating two-dimensional (2D) and three-dimensional (3D) semiconductors to realize vertical heterojunctions with novel electronic and optoelectronic properties is gaining interest from the device community. In this study, we utilize an approach that
Displaying 22926 - 22950 of 143793
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