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Search Publications

NIST Authors in Bold

Displaying 21876 - 21900 of 73697

NIST Time and Frequency Bulletin

January 18, 2013
Author(s)
Petrina C. Potts
The Time and Frequency Bulletin provides information on performance of time scales and a varieth of broadcasts (and related information) to users of the NIST services.

SRM Catalog

January 18, 2013
Author(s)
Regina R. Montgomery
SRM Catalog

Advanced Distillation Curve Analysis of Marine Diesel Fuel

January 17, 2013
Author(s)
Peter Y. Hsieh, Kathryn R. Abel, Thomas J. Bruno
Ocean-going ships burn heavy fuel oil. The combustion of heavy fuel oil in marine diesel engines emits nitrogen oxides, sulfur oxides, and particulates into the air. Growing public concern over air quality has led to increased scrutiny of heavy fuel oil as

Mapping Evidence Graphs to Attack Graphs

January 17, 2013
Author(s)
Changwei Liu, Anoop Singhal, Duminda Wijesekera
Attack graphs compute potential attack paths from a system configuration and known vulnerabilities of a system. Evidence graphs model intrusion evidence and dependencies among them for forensic analysis. In this paper, we show how to map evidence graphs to

Thermal Equilibration of Samples for Neutron Scattering

January 17, 2013
Author(s)
Tobias K Herman, Julia Scherschligt, Sarah Cunegunda Parks
Temperature relaxation and equilibration of samples for neutron scattering was investigated in a selection of samples and sample cells within the range of 5-300K. A sample model was developed that relates thermal relaxation time constants to material

Gallium Nitride Nanowires for On-Chip Optical Interconnects on Ex-Situ Substrates

January 16, 2013
Author(s)
Matthew D. Brubaker, Paul T. Blanchard, John B. Schlager, Aric W. Sanders, Alexana Roshko, Shannon M. Duff, Jason Gray, Victor M. Bright, Norman A. Sanford, Kristine A. Bertness
In this letter we report on the fabrication, device characteristics, and optical coupling of a two-nanowire device comprising light-emitting diode and photoconductive GaN nanowires. Axial p-n junction GaN nanowires were grown by molecular beam epitaxy

Using Attack Graphs in Forensic Examinations

January 16, 2013
Author(s)
Changwei Liu, Anoop Singhal, Duminda Wijesekera
Attack graphs are used to compute potential attack paths from a system configuration and known vulnerabilities of a system. Attack graphs can be used to eliminate known vulnerability sequences that can be eliminated to make attacks difficult and help

Development of NIST Measurement Science R&D Roadmap: Earthquake Risk Reduction in Buildings

January 15, 2013
Author(s)
John Hooper, William Holmes, Jack Moehle, C.B. Crouse, Robert Pekelnicky, James Harris
This report has been prepared by the Building Seismic Safety Council (BSSC) of the National Institute of Building Sciences to assist the National Institute of Standards and Technology (NIST) in planning future research efforts related to seismic safety for

MEASURING THE IMPACT OF EDUCATION AND TRAINING

January 15, 2013
Author(s)
Georgia L. Harris
As metrologists we are typically subject matter experts (SMEs) in a technical area of measurement. However, most of us are not experts in measuring the value or impact of education and training efforts using standard models for evaluation. This paper will

Segmenting Time-lapse Phase Contrast Images of Adjacent NIH 3T3 Cells

January 15, 2013
Author(s)
Joe Chalfoun, Alden A. Dima, Marcin Kociolek, Michael W. Halter, Antonio Cardone, Adele P. Peskin, Peter Bajcsy, Mary C. Brady
We present a new method for segmenting phase contrast images of NIH 3T3 fibroblast cells that is accurate even when cells are in contact. The problem of segmentation, when cells are in contact, poses a challenge to the accurate automation of cell counting

Submicrometer-Resolution Polychromatic 3D X-Ray Microscopy

January 15, 2013
Author(s)
B C. Larson, Lyle E. Levine
The ability to study the structure, microstructure, and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic 3D x-ray microscopy (3DXM) is a

Absolute spectroscopy of N2O near 4.5 um with a comb-calibrated, frequency-swept quantum cascade laser spectrometer

January 14, 2013
Author(s)
Kevin O. Knabe, Paul A. Williams, Fabrizio R. Giorgetta, Michael Radunsky, Chris Armacost, Sam Crivello, Nathan R. Newbury
We present absolute line center frequencies for 24 fundamental nu-3 ro-vibrational P-branch transitions near 4.5 um in N2O with an absolute frequency uncertainty of 800 kHz. The spectra were acquired with a swept laser spectrometer consisting of an

Extended Feature Set Profile Specification

January 14, 2013
Author(s)
Melissa Taylor, Will Chapman, Austin Hicklin, George Kiebuzinski, John Mayer-Splain, Rachel Wallner, Peter Komarinski
This specification defines Extended Feature Set (EFS) Profiles - sets of features to be used in latent friction ridge (fingerprint, palmprint or plantar) searches of automated friction ridge identification systems (AFIS). The EFS Profiles are designed to

Measurement of Scattering and Absorption Cross Sections of Dyed Microspheres

January 14, 2013
Author(s)
Adolfas Gaigalas, Steven J. Choquette
Measurements of absorbance and fluorescence emission were carried out on aqueous suspensions of polystyrene (PS) microspheres with a diameter of 2.5 µm. Microspheres with and without green BODIPY@ dye were measured. Placing the suspension inside an
Displaying 21876 - 21900 of 73697
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