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NIST Authors in Bold

Displaying 29701 - 29725 of 74292

BiCCL: The Biometric Client Configuration Language

October 1, 2008
Author(s)
Matthew L. Aronoff, Ross J. Micheals
In this paper, we introduce the Biometric Client Configuration Language, or BiCCL. BiCCL is a platform-independent, domain-specific language (DSL) that formally describes the biometric acquisition process. BiCCL uses high-level constructs---e.g., sensors

Centrifugal Length Separation of Carbon Nanotubes

October 1, 2008
Author(s)
Jeffrey A. Fagan, Matthew Becker, Jae H. Chun, Barry J. Bauer, Jeffrey R. Simpson, Angela R. Hight Walker, Erik K. Hobbie
Separation of single wall carbon nanotubes (SWCNTs) by length via centrifugation in a high density medium, and the characterization of both the separated fractions and the centrifugation process are presented. Significant quantities of the separated SWCNTs

Choosing the right detector for laser power and energy measurements

October 1, 2008
Author(s)
Marla L. Dowell
You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today’s commonplace conveniences – from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of-the-art cutting

Comparing Analytical Methods for Detecting and Characterizing Nanoparticles in Formulated Products

October 1, 2008
Author(s)
Katherine M. Tyner, Anna M. Wokovich, William H. Doub, Lucinda F. Buhse, Li Piin Sung, Stephanie S. Watson, Nakissa Sadrieh
To understand the extent of consumer exposure to nanomaterials as well as how nanomaterials impact consumer goods, it is necessary to detect and characterize nanomaterials in unmodified final products. Although there are pathways to characterize

Evaluation of Thermal Imaging Cameras

October 1, 2008
Author(s)
Francine K. Amon, Andrew J. Lock, Nelson P. Bryner, Joseph P. Rice, Howard Yoon
Four thermal infrared cameras that were provided by Bureau of Industry and Security (BIS) to NIST were each evaluated by the NIST Optical Technology Division (OTD) for three metrics: Noise-equivalent Temperature Difference (NETD), Minimum Detectable

Experimental Study of the Effects of Fuel Type, Fuel Distribribution, and Vent Size on Full-Scale Underventilated Compartment Fires in an ISO 9705 Room (NIST TN 1603)

October 1, 2008
Author(s)
Andrew J. Lock, Matthew F. Bundy, Erik L. Johnsson, Anthony P. Hamins, Gwon Ko, Cheolhong Hwang, Stephen P. Fuss, Richard H. Harris Jr.
This report describes new full-scale ISO9705 compartment fire experiments, which include local measurements of temperature and species composition. The objective of this study was to generate a database of comprehensive and accurate measurements which can

f1' EVALUATION AND MEASUREMENT COMPARISON

October 1, 2008
Author(s)
Jiangen PAN, Haiping SHEN, Yuqin Zong, Yoshi Ohno
The mismatch of spectral responsivity to the CIE V(lambda) function, i. e., the f1' index, is the most critical characteristic of photometers and tristimulus colorimeters. The f1' value varies with measurement conditions, which is often omitted in the f1'

Global Structural Analysis of the Response of World Trade Center Building 7 to Fires and Debris Impact Damage. Federal Building and Fire Safety Investigation of the World Trade Center Disaster (NIST NCSTAR 1-9A) ***DRAFT for Public Comments***

October 1, 2008
Author(s)
R A. MacNeill, Steven W. Kirkpatrick, B D. Peterson, Robert T. Bocchieri, Therese P. McAllister
The objective of the work described in this report was to analyze the global response of WTC 7 to initial failure events due to fire and to analyze the resulting sequence of component and subsystem failures to determine the events that led to the global

Hollow spherical supramolecular dendrimers

October 1, 2008
Author(s)
Virgil Percec, Mihai Peterca, Andres E. Dulcey, Mohammad Imam, Steven Hudson, Sami Nummelin, Peter Adelman, Paul A. Heiney
The synthesis of a library containing 12 conical dendrons that self-assemble into hollow spherical supramolecular dendrimers is reported. The design principles for this library were accessed by development of a method that allows the identification of

International comparisons of optical fiber power measurements

October 1, 2008
Author(s)
Igor Vayshenker, David J. Livigni, Xiaoyu X. Li, John H. Lehman
We discuss the results of optical fiber power meter (OFPM) measurements at 1302 and 1546 nm made by NIST and six national measurement institutes (NMIs). We also describe transfer standards and the associated uncertainties. The comparisons show a reasonably

Long-term Stability of the NIST Standard Ultrasonic Source

October 1, 2008
Author(s)
Steven E. Fick
The NIST Standard Ultrasonic Source (SUS) is a system comprising a transducer capable of output power levels up to 1 W at multiple frequencies between 1 MHz and 30 MHz, and an electrical impedance-matching network that allows the system to be driven by a

Modulus and Chemical Mapping of Multi-layer Coatings

October 1, 2008
Author(s)
Aaron M. Forster, Chris A. Michaels, Li Piin Sung, Justin Lucas
Thermoplastic olefins (TPO) are polymeric materials utilized for interior and exterior automotive parts. These materials are often painted to enhance appearance and protect the soft TPO substrate. TPO materials posses a low surface energy due to the

Neutron Scattering Study of the Excitation Spectrum of Solid Helium At Ultra-low Temperatures

October 1, 2008
Author(s)
Elizabeth Blackburn, John Goodkind, Sunil K. Sinha, Collin Broholm, John R. Copley, Ross W. Erwin
There has been a resurgence of interest in the properties of Solid Helium due to the recent discovery of non-classical rotational inertia (NCRI) in solid 4He by Chan and coworkers below 200 mK which they have interpreted as a transition to a "supersolid"

NEW PRACTICAL METHOD FOR MEASUREMENT OF HIGH-POWER LEDS

October 1, 2008
Author(s)
Yuqin Zong, Yoshihiro Ohno
The measurement of high-power light emitting diodes (LEDs) has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that can be used by both LED manufactures and users to acquire

Recent atomic clock comparisions at NIST

October 1, 2008
Author(s)
Luca Lorini, Neil Ashby, Anders Brusch, Scott Diddams, Robert E. Drullinger, Eric Eason, Tara Fortier, Pat Hastings, Thomas P. Heavner, David Hume, Wayne M. Itano, Steven R. Jefferts, Nathan R. Newbury, Tom Parker, Till P. Rosenband, Jason Stalnaker, William C. Swann, David J. Wineland, James C. Bergquist
The record of atomic clock frequency comparisons at NIST over the past half-decade provides one of the tightest constraints of any present-day, temporal variations of the fundamental constants. Notably, the 6-year record of increasingly precise

Robustness of display hemispherical reflectance measurement apparatus

October 1, 2008
Author(s)
John Penczek, Edward F. Kelley, Seugkwan Kim
Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard
Displaying 29701 - 29725 of 74292