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Displaying 32276 - 32300 of 74137

Anisotropic Wetting on Tunable Micro-Wrinkled Surfaces

January 1, 2007
Author(s)
Jun Y. Chung, Jeffrey Youngblood, Christopher M. Stafford
We demostrate that the buckling instability technique is promising for studying wettability because key elements of surface topography such as surface roughness can be precisely controlled by simple changes in experimental conditions. For demonstration, we

Buckling Modes of Elastic Thin Films on Elastic Substrates

January 1, 2007
Author(s)
Haixia Mei, Jun Y. Chung, Honghui Yo, Christopher Stafford, Rui Huang
Subject to compression, a thin elastic film bonded to an elastic substrate can buckle. Two buckling modes have been observed. On a stiff substrate, the film buckles when it is partly delaminated from the substrate, resulting in localized buckle patterns

Calibrated Overlay Wafer Standard

January 1, 2007
Author(s)
Michael T. Stocker, Richard M. Silver, Ravikiran Attota, Jay S. Jun
This document describes the physical characteristics of Standard Reference Material SRM 5000, provides guidance for its use in calibrating overlay (OL) tools, and gives information and precautions concerning its care and handling.Standard Reference
Displaying 32276 - 32300 of 74137