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Displaying 32326 - 32350 of 74129

Data-Based Models for Global Temperature Variations

January 1, 2007
Author(s)
Bert W. Rust, Barend J. Thijsse
This paper presents two data-based models for the measured time series of global annual average tropospheric temperatures. One model is a smoothing spline fit designed to give an optimal separation of signal from noise. The other combines an optimal spline

Development of Certified Reference Materials of Ion-Implanted Dopants in Silicon for Calibration of Secondary Ion Mass Spectrometers

January 1, 2007
Author(s)
David S. Simons, Robert G. Downing, George P. Lamaze, Richard M. Lindstrom, Robert R. Greenberg, Rick L. Paul, Susannah Schiller, William F. Guthrie
Certified reference materials have been developed for calibration of the concentrations of the most common dopants used in silicon semiconductor technology boron, arsenic, and phosphorus. These materials consist of a single dopant species that is
Displaying 32326 - 32350 of 74129