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Metrology

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Displaying 826 - 850 of 2718

Infrared Imaging and Spectroscopy Beyond the Diffraction Limit

July 22, 2015
Author(s)
Andrea Centrone
Progress in nanotechnology is enabled by and dependent on the availability of measurement methods with spatial resolution commensurate with nanomaterials’ length scales. Chemical imaging techniques, such as scattering scanning near-field optical microscopy

Analysis of the Boundary Conditions of the Spline Filter

July 21, 2015
Author(s)
D Ott, Hao H. Zhang, Daniel B. Ott, Xuezeng Zhao, Jun-Feng Song
The spline filter is a standard linear profile filter recommended by ISO/TS 16610-22 (2006). The primary advantage of the spline filter is that no end-effects occur as a result of the filter. The ISO standard also provides the tension parameter β=0.62524

Robotic Spherical Near-Field Measurements at 183 GHz

July 21, 2015
Author(s)
Michael H. Francis, Ronald C. Wittmann, David R. Novotny, Joshua A. Gordon
We describe millimeter-wave near-field measurements made with the new National Institute of Standards and Technology (NIST) robotic scanning system. This system is designed for high-frequency performance, is capable of scanning in multiple configurations

Challenges to the use of the GUM

July 15, 2015
Author(s)
Steven D. Phillips
Presentation at the BIPM on (1) Issues with the uncertainty evaluation associated with the calibration of indicating instruments; and (2) the growing problem with “outlier rejection” in measurements with measurands defined by “extreme values”

MEMS optomechanical accelerometry standards

July 8, 2015
Author(s)
Felipe Guzman, Yiliang Bao, Jason J. Gorman, John R. Lawall, Jacob M. Taylor, Thomas W. LeBrun
Current acceleration primary standards reach relative uncertainties of the order of 0.001 and consist of complex test facilities, typically operated at National Metrology Institutes. Our research focuses on the development of silicon mechanical oscillator

Optomechanical Motion Sensors

July 8, 2015
Author(s)
Felipe Guzman, Oliver Gerberding, John T. Melcher, Julian Stirling, Jon R. Pratt, Gordon A. Shaw, Jacob M. Taylor
Compact optical cavities can be combined with motion sensors to yield unprecedented resolution and SI-traceability in areas such as acceleration sensing and atomic force microscopy AFM, among others. We have incorporated Fabry-Perot fiber-optic micro

Interference and Coexistence of Wireless Systems in Critical Infrastructure

July 7, 2015
Author(s)
Galen H. Koepke, William F. Young, John M. Ladbury, Jason B. Coder
We examine interference and coexistence testing issues, test methods, and the need to update and develop new test methodologies related to the use of wireless devices in critical infrastructure systems. A case study on interference is presented along with

Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library

July 1, 2015
Author(s)
John S. Villarrubia, Andras Vladar, Bin Ming, Regis J. Kline, Daniel F. Sunday, Jasmeet Chawla, Scott List
The width and shape of 10 nm to 12 nm wide lithographically patterned SiO2 lines were measured in the scanning electron microscope by fitting the measured intensity vs. position to a physics-based model in which the lines’ widths and shapes are parameters

Using Check Standard Data to Simplify Uncertainty Estimates

July 1, 2015
Author(s)
Theodore D. Doiron
Uncertainty has proven difficult to implement in calibrations labs. The subject has mathematics and statistics that are part of normal scientific research but are seldom found among working metrologists in small calibration labs. There is, however, a

Changes for Product Labeling for Meats and Poultry with Added Solutions

June 25, 2015
Author(s)
Lisa Warfield
Article announcing the requirements for labeling meats and poultry items resulting from a U.S. Department of Agriculture, Food and Safety Inspection Services release of a ruling effective January 1, 2016. This ruling amends the regulations for descriptive

On the 209Po Half-Life Error and Its Confirmation: A Critique

June 11, 2015
Author(s)
Ronald Colle, Arthur M. Colle
Collé, et al [(2007) Appl. Radiat Isot. 65, 728; (2014) J. Phys. G: Nucl. Part. Phys. 41, 105103], over the course of nearly a decade and with decay data from a period of 20.7 years, initially uncovered and then substantiated a 25 % error in the 209Po half

Automated Guided Vehicle Bumper Test Method Development

June 2, 2015
Author(s)
Richard J. Norcross, Roger V. Bostelman, Joseph A. Falco
The National Institute of Standards and Technology (NIST) is developing test methods for contact bumpers used on Automated Guided Vehicles (AGVs) as basis for safety standards. This paper describes proposed test methods, force measurements for contact

Nanometer level sampling and control of a scanning electron microscope

June 2, 2015
Author(s)
Bradley N. Damazo, Andras Vladar, Olivier M. Marie-Rose, John A. Kramar
The National Institute of Standards and Technology (NIST) is developing a specialized, metrology scanning electron microscope (SEM), having a metrology sample stage measured by a 38 picometer resolution, high-bandwidth laser interferometer system. The

Dimensionless units in the SI

June 1, 2015
Author(s)
Peter J. Mohr, William D. Phillips
The International System of Units (SI) is supposed to be coherent. That is, when a combination of units is replaced by an equivalent unit, there is no additional numerical factor. Here we consider dimensionless units as defined in the SI, e.g. angular
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