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Electronics

Sensors

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Displaying 601 - 625 of 1388

Surface resistance and morphology of YBCO films as a function of thickness

June 1, 1997
Author(s)
F. J. Stork, James A. Beall, Alexana Roshko, Donald C. DeGroot, David A. Rudman, Ronald H. Ono, Jerzy Krupka
We have examined the thickness dependence of the growth morphology and surface resistance Rs of laser ablated YBa 2Cu 3O 7-x films with transition temperatures over 89 K and critical current densities greater than 10 6 A/cm2 at 76 K. The thickness was

AC Josephson Voltage Standard: Progress Report

April 1, 1997
Author(s)
Clark A. Hamilton, Charles J. Burroughs, Samuel Benz, Joseph R. Kinard Jr.
Progress toward a Josephson voltage standard for fast dc measurements and accurate ac waveform systhesis is described. A superconductor-normal-superconductor (SNS) junction process is used to make 5 mA critical current arrays with up to 32 768 junctions
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