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Scanning Electron Microscopy with Polarization Analysis (SEMPA): High Spatial Resolution Magnetic Imaging Status Report

Published

Author(s)

M Scheinfein, John Unguris, Daniel T. Pierce, Robert Celotta

Abstract

The scanning electron microscopy with polarization analysis (SEMPA) technique as a means of observing magnetic microstructure is surveyed. A brief description of the technique is given. Particular emphasis is paid to the spin-polarization detector as the critical element in the SEMPA system.
Proceedings Title
NSF/CNRS Workshop on Electron Beam Induced High Spatial Resolution Spectroscopies
Conference Dates
February 28-March 5, 1988
Conference Location
Aussois, France, FR

Keywords

ELECTRON, SPECTROSCOPIES, SPECTROSCOPY

Citation

Scheinfein, M. , Unguris, J. , Pierce, D. and Celotta, R. (1988), Scanning Electron Microscopy with Polarization Analysis (SEMPA): High Spatial Resolution Magnetic Imaging Status Report, NSF/CNRS Workshop on Electron Beam Induced High Spatial Resolution Spectroscopies, Aussois, France, FR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620315 (Accessed May 18, 2024)

Issues

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Created December 31, 1987, Updated October 12, 2021