We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
Conference Dates: June 2-7, 2002
Conference Location: Seattle, WA
Conference Title: 2002 IEEE MTT-S International Microwave Symposium
Pub Type: Conferences
large-signal measurements, measurement based models, model evaluation meters, nonlinear circuits, nonlinear network analysis