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Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy

Published

Author(s)

LC Teague, Oana Jurchescu, Curt A. Richter, Sankar Subramanian, John E. Anthony, Thomas Jackson, David J. Gundlach, James G. Kushmerick

Citation

Teague, L. , Jurchescu, O. , Richter, C. , Subramanian, S. , Anthony, J. , Jackson, T. , Gundlach, D. and Kushmerick, J. (2010), Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy (Accessed March 28, 2024)
Created June 22, 2010, Updated October 12, 2021