Jeffery, A.
, Elmquist, R.
and Cage, M.
(1995),
Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=20765
(Accessed October 8, 2024)
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Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections
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Journal of Research (NIST JRES) -
Volume
100
Issue
6
NIST Pub Series
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NIST Pubs
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Created October 31, 1995, Updated October 12, 2021