A set of polarized low-energy-electon diffraction (PLEED) data from a W(100) surface measured using a polairzed electron beam is presented. The data include conventional LEED profilesI(E,θ) as well as S(Eθ profiles which measure the spin dependence of the scattering. These profiles are obtained for specular beams at angles of incidence from 9°-24° and for five nonspecular beams at normal incidence. The potential usefulness of S(E, θ) profiles for structure determination is discussed and the use of PLEED for spin analysis is assessed.
Citation: Physical Review B (Condensed Matter and Materials Physics)
Pub Type: Journals