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Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region

Published

Author(s)

T Saito, L R. Hughey, James E. Proctor, Thomas R. O'Brian
Citation
Review of Scientific Instruments
Volume
A10

Citation

Saito, T. , Hughey, L. , Proctor, J. and O'Brian, T. (1996), Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region, Review of Scientific Instruments (Accessed April 23, 2024)
Created December 31, 1995, Updated October 12, 2021