Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region

Published

Author(s)

T Saito, L R. Hughey, James E. Proctor, Thomas R. O'Brian
Citation
http://www.aps.anl.gov/xfd/WWW/xfd/communicator/announce1095/abstracts/a10.pdf

Citation

Saito, T. , Hughey, L. , Proctor, J. and O'Brian, T. (1996), Polarization Characteristics of Silicon Photodiodes and Its Dependence on Oxide Thickness in the Far UV Region, http://www.aps.anl.gov/xfd/WWW/xfd/communicator/announce1095/abstracts/a10.pdf, [online], http://www.aps.anl.gov/xfd/WWW/xfd/communicator/announce1095/abstracts/a10.pdf (Accessed February 21, 2024)
Created December 31, 1995, Updated October 12, 2021