Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensity of the grains upon reading gives a visual representation of where electrons struck the plate. This direct measurement of electron scatter is important to improving models and analytical correction procedures.
Proceedings Title: Microscopy and Microanalysis 2000 Meeting; Microscopy and Microanalysis 2000, Annual Meeting | 58th | | Springer
Issue: Suppl. 2
Conference Dates: August 1, 2000
Conference Location: xxxx, -1
Conference Title: Microscopy and Microanalysis Society
Pub Type: Conferences
electron, ESEM, imaging, phosphor, plate, scattering