DeSalvo, J.
, Hati, A.
, Nelson, C.
and Howe, D.
(2012),
Phase-Noise Measurement of a 670 GHz Source, Proceedings of the 2012 IEEE International Frequency Control Symposium, Baltimore, MD (Accessed May 8, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Phase-Noise Measurement of a 670 GHz Source
Published
Author(s)
, , ,
Abstract
We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.Proceedings Title
Proceedings of the 2012 IEEE International Frequency Control Symposium
Conference Dates
May 22-24, 2012
Conference Location
Baltimore, MD
Conference Title
2012 IEEE International Frequency Control Symposium
Pub Type
Conferences
Keywords
frequency control, harmonic mixers, metrology, phase noise, ubmillimeter wave measurements
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created May 24, 2012, Updated February 19, 2017