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Phase-Noise Measurement of a 670 GHz Source

Published

Author(s)

Jason A. DeSalvo, Archita Hati, Craig W. Nelson, David A. Howe

Abstract

We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve a phase-noise measurement system in waveguide (WR1.5). At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
Proceedings Title
Proceedings of the 2012 IEEE International Frequency Control Symposium
Conference Dates
May 22-24, 2012
Conference Location
Baltimore, MD
Conference Title
2012 IEEE International Frequency Control Symposium

Keywords

frequency control, harmonic mixers, metrology, phase noise, ubmillimeter wave measurements

Citation

DeSalvo, J. , Hati, A. , Nelson, C. and Howe, D. (2012), Phase-Noise Measurement of a 670 GHz Source, Proceedings of the 2012 IEEE International Frequency Control Symposium, Baltimore, MD (Accessed May 23, 2024)

Issues

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Created May 24, 2012, Updated February 19, 2017