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On Peculiarities of S-Parameter Measurements

Published

Author(s)

Yves Rolain, Wendy Van Moer, Jeffrey Jargon, Donald C. DeGroot

Abstract

Measured S-parameters are a key factor for many measurement/modeling applications. Experience teaches that quantities that are derived from the measurements can contain spikes, and that they tend to grow with connection imperfections. In this paper, a possible theoretical explanation is sought and the presence of the peaks is shown on practical measurements. The measured propagation factor and characteristic impedance of a transmission line are used as an illustrative example.
Proceedings Title
ARFTG Microwave Measurement Conference
Conference Dates
June 12-17, 2005
Conference Location
Long Beach, CA, USA
Conference Title
65th ARFTG MICROWAVE MEASUREMENT CONFERENCE MEASUREMENTS FOR MILLIMETER-WAVE APPLICATIONS

Keywords

impedance, measurements, microwaves, propagation constant, transmission lines

Citation

Rolain, Y. , Van Moer, W. , Jargon, J. and DeGroot, D. (2005), On Peculiarities of S-Parameter Measurements, ARFTG Microwave Measurement Conference, Long Beach, CA, USA (Accessed July 22, 2024)

Issues

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Created June 16, 2005, Updated October 12, 2021