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Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry

Published

Author(s)

Dominic F. Vecchia, Chih-Ming Wang, M. Young
Proceedings Title
Proc., Measurement Science Conference
Conference Dates
January 21-22, 1993
Conference Location
Los Angeles, CA, USA

Citation

Vecchia, D. , Wang, C. and Young, M. (1993), Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry, Proc., Measurement Science Conference, Los Angeles, CA, USA (Accessed September 23, 2023)
Created December 31, 1992, Updated October 12, 2021