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PUBLICATIONS

Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry

Published

Author(s)

Dominic F. Vecchia, Chih-Ming Wang, M. Young
Proceedings Title
Proc., Measurement Science Conference
Conference Dates
January 21-22, 1993
Conference Location
Los Angeles, CA, USA
Pub Type
Conferences

Citation

Vecchia, D. , Wang, C. and Young, M. (1993), Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry, Proc., Measurement Science Conference, Los Angeles, CA, USA (Accessed October 23, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 1992, Updated October 12, 2021
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