Vecchia, D.
, Wang, C.
and Young, M.
(1993),
Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry, Proc., Measurement Science Conference, Los Angeles, CA, USA
(Accessed May 10, 2025)
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Outlier-Resistant Fitting of Gray-Scale Images Illustrated by Optical Fiber Geometry
Published
Author(s)
, , M. Young
Proceedings Title
Proc., Measurement Science Conference
Conference Dates
January 21-22, 1993
Conference Location
Los Angeles, CA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1992, Updated October 12, 2021