Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Optical Frequency Standard Using Trapped Hg+ Ions

Published

Author(s)

B C. Young, F C. Cruz, D J. Berkeland, R J. Rafac, James C. Bergquist, Wayne M. Itano, David J. Wineland
Proceedings Title
Conf. on Trapped Charged Particles and Fundamental Physics
Conference Dates
September 1-4, 1998
Conference Location
Asilomar, CA, USA
Conference Title
Proc. Conf. on Trapped Charged Particles and Fundamental Physic

Citation

Young, B. , Cruz, F. , Berkeland, D. , Rafac, R. , Bergquist, J. , Itano, W. and Wineland, D. (1998), Optical Frequency Standard Using Trapped Hg<sup>+</sup> Ions, Conf. on Trapped Charged Particles and Fundamental Physics , Asilomar, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=105716 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 13, 1998, Updated October 12, 2021