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Novel Fabrication of Micromechanical Oscillators With Nanoscale Sensitivity at Room Temperature



Michelle Chabot, John M. Moreland, Lan Gao, Sy-Hwang Liou, C. W. Miller


In this paper, we report on the design, fabrication, and implementation of ultrasensitive micromechanical oscillators. Our ultrathin single-crystal silicon cantilevers with integrated magnetic structures are the first of their kind: They are fabricated using a novel high-yield process in which magnetic film patterning and deposition are combined with cantilever fabrication. These novel devices have been developed for use as cantilever magnetometers and as force sensors in nuclear magnetic resonance force microscopy (MRFM). These two applications have achieved nanometer-scale resolution using the cantilevers described in this work. Current magnetic moment sensitivity achieved for the devices, when used as magnetometers, is 10-15 J/T at room temperature, which is more than a 1000-fold improvement in sensitivity, compared to conventional magnetometers. Current room temperature force sensitivity of MRFM cantilevers is {approximately equal}10^-16^ N/√–Hz, which is comparable to the room temperature sunsitivities of similar devices of its type. Finite element modeling was used to improve design parameters, ensure that the devices meet xperimental demands, and correlate mode shape with observed results. The photolithographic fabrication process was optimized, yielding an average of {approximately equal}85% and alignment better than 1 υm. Postfabrication focused ion-beam milling was used to further pattern the integrated magnetic structures when nanometer scale dimensions were required.
Journal of Microelectromechanical Systems


AFM cantilever, magnetic resonance force microscopy, Micro-mechanical, nano-scale magnets, torque magnetometer, torsional oscillator
Created October 5, 2005, Updated January 27, 2020