Harman, G.
(1979),
Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousticemission techniques:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-59
(Accessed January 26, 2025)
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Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousticemission techniques:
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- NBS SP 400-59
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NBS SP 400-59
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NIST Pubs
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Created January 1, 1979, Updated May 19, 2023