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Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousticemission techniques:

Published

Author(s)

George G Harman
Citation
- NBS SP 400-59
Report Number
NBS SP 400-59

Citation

Harman, G. (1979), Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousticemission techniques:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-59 (Accessed April 16, 2024)
Created January 1, 1979, Updated May 19, 2023