@misc{1161736,
  author = {George G Harman},
  title = {Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acousticemission techniques:},
  year = {1979},
  month = {1979-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.SP.400-59},
  language = {en},
}