Non-Linear Large-Signal Scattering Parameters: Theory and Applications

Published

June 11, 2004

Author(s)

Jeffrey Jargon, Kuldip Gupta, Donald C. DeGroot

Abstract

We introduce nonlinear large-signal scattering parameters, a new type of frequency-domain mapping that relates incident and reflected signals for sparse-tone inputs. We present a general form of nonlinear large-signal scattering parameters and show that they reduce to classic S-parameters are also introduced, and equations relating the different representations are derived. We illustrate how nonlinear circuit, specifically a single-diode 1 GHz frequency-doubler. For the case where a nonlinear model is not readily available, we developed a method of extracting nonlinear large-signal scattering parameters obtained with artificial neural network models trained with multiple measurements made by a nonlinear vector network analyzer equipped with two sources.

Proceedings Title

63rd ARFTG Microwave Measurements Conference On-Wafer Characterization

Conference Dates

June 6-11, 2004

Conference Location

Fort Worth, TX, USA

Conference Title

ARFTG Microwave Measurement Conference

Pub Type

Conferences

Keywords

frequency domain, large-signal, measurement, microwave, model, network analyzer, nonlinear, scattering parameter.

Citation

Jargon, J. , Gupta, K. and DeGroot, D. (2004), Non-Linear Large-Signal Scattering Parameters: Theory and Applications, 63rd ARFTG Microwave Measurements Conference On-Wafer Characterization, Fort Worth, TX, USA (Accessed October 16, 2025)