TY  - CONF
AU  - Jeffrey Jargon
AU  - Kuldip Gupta
AU  - Donald DeGroot
C2  - 63rd ARFTG Microwave Measurements Conference On-Wafer Characterization, Fort Worth, TX, USA
DA  - 2004-06-11 00:06:00
LA  - en
PB  - 63rd ARFTG Microwave Measurements Conference On-Wafer Characterization, Fort Worth, TX, USA
PY  - 2004
TI  - Non-Linear Large-Signal Scattering Parameters: Theory and Applications
ER  -