Published: November 01, 2001
Chad R. Snyder, F I. Mopsik
The coefficient of thermal expansion (CTE) continues to be a critical parameter in modeling for the microelectronics industry. Over the past several years, NIST has worked to develop a robust and highly accurate means for determined the CTE of polymer films with thicknesses ranging from 2 m up to 1 cm. To make this metrology accessible to a wider community and to help users to adhere to good practice procedures when using this metrology, this Guide was created. At the end of this Guide, the data reduction technique necessary for using this metrology for the determination of hygrothermal expansion is discussed and a detailed look at the uncertainties associated with this metrology is provided.
Citation: Special Publication (NIST SP) - 960-7Report Number:
NIST Pub Series: Special Publication (NIST SP)
Pub Type: NIST Pubs
capacitance cell, guarded electrode, high sensitivity displacement, innerlayer dielectrics, polymers, thermal expansion, thin films
Created November 01, 2001, Updated March 23, 2018