We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force microscope tip. Several samples cut from the same disk were measured with a single tip. We have also measured a single transition with several tips. Both measurement have shown the variability in images taken with differnt tips and different instrument configuration which underscores the need for a well calibrated sample.
Proceedings Title: Proceedings of the Fourth Workshop on Industrial Applications of Scanned Probe Microscopy
Conference Dates: May 8, 1997
Conference Location: Gaithersburg, MD
Conference Title: Fourth Workshop on Industrial Applications of Scanned Probe Microscopy
Pub Type: Conferences