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NIST Databases With Electron Elastic-Scattering Cross Sections, Inelastic Mean Free Paths, and Effective Attenuation Lengths

Published

Author(s)

Cedric J. Powell, Aleksander Jablonski, Francesc Salvat

Abstract

A brief description is given of three databases issued by the US National Institute of Standards and Technology (NIST). These databases, designed principally for applications in Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS), provide electron elastic-scattering cross sections, electron inelastic mean free paths, and electron effective attenuation lengths. Examples are given of their use.
Citation
Surface and Interface Analysis
Volume
37
Issue
No. 11

Keywords

electron spectroscopy, Gordon Research Conferences

Citation

Powell, C. , Jablonski, A. and Salvat, F. (2005), NIST Databases With Electron Elastic-Scattering Cross Sections, Inelastic Mean Free Paths, and Effective Attenuation Lengths, Surface and Interface Analysis (Accessed April 20, 2024)
Created November 1, 2005, Updated February 17, 2017