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PUBLICATIONS

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

Published

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

Abstract

See attached
Conference Dates
May 29-30, 2008
Conference Location
Blacksburg, VA
Conference Title
Mechanics Conference to Celebrate the 100th Anniversary of the Department of Engineering Science and Mechanics
Pub Type
Conferences

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Keywords

AFM cantilever calibration, electrostatic forces, limit cycle, magnetic actuation, magnetic sensing, micro-oscillator, Si-traceable nanoforces, velocity standard.
Chemical engineering and processing and Metrology

Citation

Vogl, G. , Gorman, J. , Shaw, G. and Pratt, J. (2008), A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy, Mechanics Conference to Celebrate the 100th Anniversary of the Department of Engineering Science and Mechanics, Blacksburg, VA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824439 (Accessed April 23, 2024)

Created May 29, 2008, Updated February 19, 2017