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PUBLICATIONS

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

Published

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

Abstract

See attached
Conference Dates
May 29-30, 2008
Conference Location
Blacksburg, VA
Conference Title
Mechanics Conference to Celebrate the 100th Anniversary of the Department of Engineering Science and Mechanics
Pub Type
Conferences

Download Paper

Local Download

Keywords

AFM cantilever calibration, electrostatic forces, limit cycle, magnetic actuation, magnetic sensing, micro-oscillator, Si-traceable nanoforces, velocity standard.
Chemical engineering and processing and Metrology

Citation

Vogl, G. , Gorman, J. , Shaw, G. and Pratt, J. (2008), A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy, Mechanics Conference to Celebrate the 100th Anniversary of the Department of Engineering Science and Mechanics, Blacksburg, VA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824439 (Accessed October 17, 2025)

Issues

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Created May 29, 2008, Updated February 19, 2017
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