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A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

Published

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

Abstract

See attached
Conference Dates
May 29-30, 2008
Conference Location
Blacksburg, VA
Conference Title
Mechanics Conference to Celebrate the 100th Anniversary of the Department of Engineering Science and Mechanics

Keywords

AFM cantilever calibration, electrostatic forces, limit cycle, magnetic actuation, magnetic sensing, micro-oscillator, Si-traceable nanoforces, velocity standard.

Citation

Vogl, G. , Gorman, J. , Shaw, G. and Pratt, J. (2008), A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy, Mechanics Conference to Celebrate the 100th Anniversary of the Department of Engineering Science and Mechanics, Blacksburg, VA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824439 (Accessed May 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 29, 2008, Updated February 19, 2017