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PUBLICATIONS

New Developments in Excimer Laser Metrology at 157 and 193 nm

Published

Author(s)

Marla L. Dowell, Richard D. Jones, Holger Laabs, Christopher L. Cromer

Abstract

Abstract for oral presentation on NIST 157 nm laser measurement facility.
Proceedings Title
Proc., Intl. Symp. on 157 nm Laser Measurements
Conference Dates
October 3-4, 2001
Conference Location
Ft. Lauderdale, FL, USA
Pub Type
Conferences

Keywords

laser measurements, lithography

Citation

Dowell, M. , Jones, R. , Laabs, H. and Cromer, C. (2002), New Developments in Excimer Laser Metrology at 157 and 193 nm, Proc., Intl. Symp. on 157 nm Laser Measurements, Ft. Lauderdale, FL, USA (Accessed October 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created April 10, 2002, Updated October 12, 2021
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