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A Neural Network Approach for Classifying Test Structure Results

Published

Author(s)

D. Khera, Mona E. Zaghloul, Loren W. Linholm, Charles L. Wilson
Proceedings Title
Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures
Conference Dates
March 13-14, 1989
Conference Location
Edinburgh, 1, UK

Citation

Khera, D. , Zaghloul, M. , Linholm, L. and Wilson, C. (1989), A Neural Network Approach for Classifying Test Structure Results, Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures, Edinburgh, 1, UK (Accessed February 25, 2024)
Created December 30, 1989, Updated October 12, 2021