TY  - CONF
AU  - D. Khera
AU  - Mona Zaghloul
AU  - Loren Linholm
AU  - Charles Wilson
C2  - Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures, Edinburgh, 1, UK
DA  - 1989-12-31 00:12:00
LA  - en
PB  - Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures, Edinburgh, 1, UK
PY  - 1989
TI  - A Neural Network Approach for Classifying Test Structure Results
ER  -