Knight, S.
and Settle-Raskin, A.
(1998),
National Semiconductor Metrology Program::project portfolio, FY 1998, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.5851r1998
(Accessed September 11, 2024)
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National Semiconductor Metrology Program::project portfolio, FY 1998
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- NIST IR 5851r1998
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NIST IR 5851r1998
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Created January 1, 1998, Updated May 19, 2023