TY  - GEN
AU  - Knight, Stephen
AU  - Settle-Raskin, Alice D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1998-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.5851r1998
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1998
TI  - National Semiconductor Metrology Program::project portfolio, FY 1998
ER  -