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Nanophotonic atomic force microscope transducers enable chemical composition and thermal conductivity measurements at the nanoscale

Published

Author(s)

Jungseok Chae, Sangmin An, Georg Ramer, Vitalie Stavila, Glenn E. Holland, Yohan Yoon, Talin Alec, Mark Allendorf, Vladimir A. Aksyuk, Andrea Centrone

Abstract

The atomic force microscope (AFM) offers a rich observation window on the nanoscale, yet many dynamic phenomena are too fast and too weak for direct detection, urging measurement innovation. Integrated cavity-optomechanics is revolutionizing micromechanical sensing, but its implementation in AFM remains challenging. Here, picogram-scale probes are integrated with photonic resonators, to enable
Citation
Nano Letters
Volume
17
Issue
9

Keywords

AFM, MEMS, PTIT, Chemical Composition, Thermal Conductivity
Created September 13, 2017, Updated November 10, 2018