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PUBLICATIONS

Nanoelectronic Characterization using Microwave Near-Field Microscopy

Published

Author(s)

Samuel Berweger, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
Citation
IEEE Microwave Magazine
Pub Type
Journals

Download Paper

Local Download
Nanotechnology and Condensed matter

Citation

Berweger, S. , Wallis, T. and Kabos, P. (2020), Nanoelectronic Characterization using Microwave Near-Field Microscopy, IEEE Microwave Magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928045 (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 4, 2020, Updated September 29, 2025
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