Berweger, S.
, Wallis, T.
and Kabos, P.
(2020),
Nanoelectronic Characterization using Microwave Near-Field Microscopy, IEEE Microwave Magazine
(Accessed December 2, 2023)
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Nanoelectronic Characterization using Microwave Near-Field Microscopy
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IEEE Microwave Magazine
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Journals
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Created September 4, 2020, Updated February 9, 2023