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Nanoelectronic Characterization using Microwave Near-Field Microscopy

Published

Author(s)

Samuel Berweger, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
Citation
IEEE Microwave Magazine

Citation

Berweger, S. , Wallis, T. and Kabos, P. (2020), Nanoelectronic Characterization using Microwave Near-Field Microscopy, IEEE Microwave Magazine (Accessed June 23, 2024)

Issues

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Created September 4, 2020, Updated February 9, 2023