@article{1292576,
  author = {Samuel Berweger and Thomas Mitchell (Mitch) Wallis and Pavel Kabos},
  title = {Nanoelectronic Characterization using Microwave Near-Field Microscopy},
  year = {2020},
  month = {2020-09-04 04:09:00},
  publisher = {IEEE Microwave Magazine},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=928045},
  language = {en},
}