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Nail to nail fingerprint challenge::enrollment set size variability

Published

Author(s)

Gregory Fiumara, Kenneth Ko, Elham Tabassi, Patricia Flanagan, John Grantham, Karen Marshall, Matthew Schwarz, Bryan Woodgate, Christopher Boehnen
Citation
- NIST IR 8257
Report Number
NIST IR 8257

Citation

Fiumara, G. , Ko, K. , Tabassi, E. , Flanagan, P. , Grantham, J. , Marshall, K. , Schwarz, M. , Woodgate, B. and Boehnen, C. (2019), Nail to nail fingerprint challenge::enrollment set size variability, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.8257 (Accessed March 28, 2024)
Created June 1, 2019, Updated May 20, 2023