TY  - GEN
AU  - Fiumara, Gregory
AU  - Ko, Kenneth
AU  - Tabassi, Elham
AU  - Flanagan, Patricia
AU  - Grantham, John
AU  - Marshall, Karen
AU  - Schwarz, Matthew
AU  - Woodgate, Bryan
AU  - Boehnen, Christopher
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-06-01 04:06:00
DO  - https://doi.org/10.6028/NIST.IR.8257
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Nail to nail fingerprint challenge::enrollment set size variability
ER  -