TY  - GEN
AU  - Gregory Fiumara
AU  - Kenneth Ko
AU  - Elham Tabassi
AU  - Patricia Flanagan
AU  - John Grantham
AU  - Karen Marshall
AU  - Matthew Schwarz
AU  - Bryan Woodgate
AU  - Christopher Boehnen
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-06-01 04:06:00
DO  - https://doi.org/10.6028/NIST.IR.8257
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Nail to nail fingerprint challenge::enrollment set size variability
ER  -