Kim, J.
, Seiler, D.
and Tseng, W.
(1993),
Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements, Journal of Applied Physics
(Accessed January 21, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
Published
Author(s)
, , W. F. Tseng
Citation
Journal of Applied Physics
Volume
73
Issue
12
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 14, 1993, Updated October 12, 2021