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Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements

Published

Author(s)

Jin S. Kim, David G. Seiler, W. F. Tseng
Citation
Journal of Applied Physics
Volume
73
Issue
12

Citation

Kim, J. , Seiler, D. and Tseng, W. (1993), Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements, Journal of Applied Physics (Accessed April 13, 2024)
Created June 14, 1993, Updated October 12, 2021