TY  - JOUR
AU  - Kim, Jin
AU  - Seiler, David
AU  - Tseng, W.
C2  - Journal of Applied Physics
DA  - 1993-06-15 00:06:00
LA  - en
M1  - 73
PB  - Journal of Applied Physics
PY  - 1993
TI  - Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
ER  -