Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Modeling Microstructures with OOF2

Published

Author(s)

Andrew C. Reid, Rhonald Lua, R E. Garcia, Valerie R. Coffman, Stephen A. Langer

Abstract

OOF2 is a program for computing the properties and behavior of material microstructures, beginning with an image of the microstructural geometry. OOF2 uses finite elements, but is designed to be used by materials scientists with little or no finite element experience. It can solve a wide range of physical phenomena and can be (and is being) extended to solve even more. This paper is an introduction to some of the features of OOF2.
Citation
International Journal of Materials and Product Technology
Volume
35

Keywords

finite element, microstructure

Citation

Reid, A. , Lua, R. , Garcia, R. , Coffman, V. and Langer, S. (2009), Modeling Microstructures with OOF2, International Journal of Materials and Product Technology, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51176 (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 1, 2009, Updated January 27, 2020
Was this page helpful?