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Microelectronic test pattern NBS-4:

Published

Author(s)

W Robert Thurber, Martin G Buehler
Citation
- NBS SP 400-32
Report Number
NBS SP 400-32

Citation

Thurber, W. and Buehler, M. (1978), Microelectronic test pattern NBS-4:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-32 (Accessed October 14, 2024)

Issues

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Created January 1, 1978, Updated May 19, 2023