Thurber, W.
and Buehler, M.
(1978),
Microelectronic test pattern NBS-4:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-32
(Accessed April 26, 2024)
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Microelectronic test pattern NBS-4:
Published
Author(s)
,
Citation
- NBS SP 400-32
Report Number
NBS SP 400-32
Pub Type
NIST Pubs
Download Paper
Citation
Created January 1, 1978, Updated May 19, 2023