Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Metrology of Localized Inhomogeneity in Optical Glass

Published

Author(s)

Angela Davies

Abstract

The optical glass industry does not have a standard method of quantiatively evaluating localized inhomogeneities (striae). We are developing an interferometric method and find that the measured wavefront distortion depends on sample position and focus.
Proceedings Title
Proceedings of the Optical Fabrication and Testing Conference
Conference Dates
June 1, 0018
Conference Location
Quebec City, 1, CA
Conference Title
Optical Fabrication and Testing Conference

Keywords

glass, industry, instrumentation, measurement, metrology, optical glass, optics

Citation

Davies, A. (2008), Metrology of Localized Inhomogeneity in Optical Glass, Proceedings of the Optical Fabrication and Testing Conference, Quebec City, 1, CA (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 16, 2008
Was this page helpful?