Methods for TEM analysis of NIST s single-walled carbon nanotube Standard Reference Material

Published

August 20, 2009

Author(s)

Elisabeth Mansfield, Roy H. Geiss, Jeffrey A. Fagan

Abstract

The National Institute of Standards and Technology (NIST) is releasing a series of single-walled carbon nanotube Standard Reference Materials (SRMs) to provide consumers with a well-characterized material for their applications. The SWCNT Reference Material will be introduced as a series of three types of material: 1) raw soot characterized for composition, 2) purified (> 90% SWCNT) bucky paper and 3) dispersed, length sorted populations characterized by length. A selection of dispersing solvents, including organic solvents, aqueous surfactants and DNA dispersions, were prepared and examined by transmission electron microscopy (TEM). Recommendations for sample preparation of the SWCNT SRM 2483 to yield similar structures are given. Examples of images of the length sorted SWCNT reference material are also shown.

Proceedings Title

SPIE Proceedings, Nano Science and Engineering 2009

Volume

7405

Conference Dates

August 2-6, 2009

Conference Location

San Diego, CA

Conference Title

SPIE Optics and Photonics, Nano Science and Engineering

Pub Type

Conferences

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Keywords

Single-walled carbon nanotubes, TEM, Standard Reference Material

Citation

Mansfield, E. , Geiss, R. and Fagan, J. (2009), Methods for TEM analysis of NIST s single-walled carbon nanotube Standard Reference Material, SPIE Proceedings, Nano Science and Engineering 2009, San Diego, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903069 (Accessed December 6, 2024)