Bullis, W.
(1968),
Methods of measurement for semiconductor materials, process control, and devices.:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.472
(Accessed September 9, 2024)
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Methods of measurement for semiconductor materials, process control, and devices.:
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- NBS TN 472
Report Number
NBS TN 472
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NIST Pubs
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Created January 1, 1968, Updated May 19, 2023