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A Method of Determining the Emission and Susceptibility Levels of Electrically Small Objects Using a TEM Cell

Published

Author(s)

M T. Ma, D. C. Chang, Ippalapalli Sreenivasiah
Citation
Technical Note (NIST TN) - 1040
Report Number
1040

Citation

Ma, M. , Chang, D. and Sreenivasiah, I. (1981), A Method of Determining the Emission and Susceptibility Levels of Electrically Small Objects Using a TEM Cell, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/nbs.tn.1040 (Accessed April 12, 2024)
Created April 1, 1981, Updated November 10, 2018