Ma, M.
, Chang, D.
and Sreenivasiah, I.
(1981),
A Method of Determining the Emission and Susceptibility Levels of Electrically Small Objects Using a TEM Cell, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/nbs.tn.1040
(Accessed March 13, 2025)
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A Method of Determining the Emission and Susceptibility Levels of Electrically Small Objects Using a TEM Cell
Published
Author(s)
M T. Ma, D. C. Chang, Ippalapalli Sreenivasiah
Citation
Technical Note (NIST TN) - 1040
Report Number
1040
NIST Pub Series
Pub Type
NIST Pubs
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Citation
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Created April 1, 1981, Updated November 10, 2018