Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Mechanical Deformation in Conductive Adhesives as Measured with Electron-Beam Moire

Published

Author(s)

Elizabeth S. Drexler, J R. Berger

Abstract

Two forms (paste and film) of isotropically conductive adhesives (Cas) were mechanically loaded in shear mode.
Citation
Journal of Electronic Packaging
Volume
121

Keywords

CA, conductive adhesive, electron-beam moire, ICA, moire, shear strength

Citation

Drexler, E. and Berger, J. (1999), Mechanical Deformation in Conductive Adhesives as Measured with Electron-Beam Moire, Journal of Electronic Packaging (Accessed October 15, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created June 1, 1999, Updated February 17, 2017
Was this page helpful?